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1.
Applied Bayesian Modelling by Series: Wiley Series in Probability and Statistics | Balding, David J. (Ed.) | Bloomfield, Peter (Ed.) | Cressie, Noel A.C. (Ed.) | et al
Edition: 1. Ed., Repr. with corrections
Language: English
Publication details: Chichester, Hoboken, NJ, San Francisco, CA : John Wiley and Sons 2004, February
Availability: Items available for loan: Institute for Advanced Studies (IHS) (1)Call number: 18439-A.

2.
Bayesian Statistics and Marketing by Series: Wiley Series in Probability and Statistics | Balding, David J. (Ed.) | Bloomfield, Peter (Ed.) | Cressie, Noel A.C. (Ed.) | et al
Edition: 1. Ed.
Language: English
Publication details: Chichester, Hoboken, NJ, San Francisco, CA : John Wiley and Sons 2005
Availability: Items available for loan: Institute for Advanced Studies (IHS) (1)Call number: 18746-A.

3.
Contemporary Bayesian Econometrics and Statistics by Series: Wiley Series in Probability and Statistics | Balding, David J. (Ed.) | Cressie, Noel A.C. (Ed.) | Fisher, Nicholas I. (Ed.) | et al
Edition: 1. Ed.
Language: English
Publication details: Hoboken, New Jersey : John Wiley and Sons, Inc., Wiley-Interscience 2005
Availability: Items available for loan: Institute for Advanced Studies (IHS) (1)Call number: 18696-A.

4.
Reliability and Risk ; A Bayesian Perspective by Series: Wiley Series in Probability and Statistics | Balding, David J. (Ed.) | Bloomfield, Peter (Ed.) | Cressie, Noel A.C. (Ed.) | et al
Edition: 1. Ed.
Language: English
Publication details: Chichester, Hoboken, NJ, San Francisco, CA : John Wiley and Sons 2006
Availability: Items available for loan: Institute for Advanced Studies (IHS) (1)Call number: 19034-A.

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